Listar INIT_Articles por autoría "652abe0f-77eb-4e83-b964-efaf588466f7"
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Spatial threshold exceedance analysis through marked point processes
Mateu, Jorge; Madrid, Alfonso E.; Angulo, J.M. Wiley- Blackwell (2012)Indicators of recurrence, persistence and, in general, distribution patterns of extremal events defined by random field threshold exceedances provide relevant information on critical phenomena for risk assessment. Such ...