Phase calibration of spatial light modulators by means of Fresnel images
Ver/ Abrir
Impacto
Scholar |
Otros documentos de la autoría: Martínez-León, Lluís; Jaroszewicz, Z.; Kołodziejczyk, A.; Durán, Vicente; Tajahuerce, Enrique; Lancis, Jesús
Metadatos
Mostrar el registro completo del ítemcomunitat-uji-handle:10234/9
comunitat-uji-handle2:10234/2507
comunitat-uji-handle3:10234/6973
comunitat-uji-handle4:
INVESTIGACIONMetadatos
Título
Phase calibration of spatial light modulators by means of Fresnel imagesAutoría
Fecha de publicación
2009Editor
Institute of PhysicsISSN
1464-4258:Cita bibliográfica
MARTÍNEZ-LEÓN, Ll, et al. Phase calibration of spatial light modulators by means of Fresnel images. Journal of Optics A: Pure and Applied Optics, 2009, vol. 11, no 12, p. 125405.Tipo de documento
info:eu-repo/semantics/articleVersión de la editorial
https://iopscience.iop.org/article/10.1088/1464-4258/11/12/125405Versión
info:eu-repo/semantics/submittedVersionPalabras clave / Materias
Resumen
Reliable application of spatial light modulators (SLMs) as programmable diffractive optical elements
requires a thorough calibration. In this paper, we propose a method for calibrating SLMs based on the
evaluation ... [+]
Reliable application of spatial light modulators (SLMs) as programmable diffractive optical elements
requires a thorough calibration. In this paper, we propose a method for calibrating SLMs based on the
evaluation of Fresnel images. Fresnel images generated by a binary phase diffraction grating consist of
binary irradiance distributions whose visibility depends on the phase modulation. By displaying on our
device a diffraction grating with a binary phase step along one direction and a linearly increasing phase
along the orthogonal direction, we perform a complete phase calibration. In this way, the phase
modulation for every pixel and for every value of the entrance signal can be determined experimentally.
Additionally, data acquisition can be significantly simplified with this scheme [-]
Publicado en
Journal of Optics A: Pure and Applied Optics, 2009, v. 11, n. 12Derechos de acceso
Aparece en las colecciones
- FCA_Articles [511]