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dc.contributor.authorMoliner-Heredia, Rubén
dc.contributor.authorBruscas Bellido, Gracia M.
dc.contributor.authorAbellán-Nebot, José V.
dc.contributor.authorPeñarrocha-Alós, Ignacio
dc.date.accessioned2022-11-23T15:39:12Z
dc.date.available2022-11-23T15:39:12Z
dc.date.issued2021
dc.identifier.citationMOLINER-HEREDIA, Rubén, et al. A Sequential Inspection Procedure for Fault Detection in Multistage Manufacturing Processes. Sensors, 2021, vol. 21, núm. 22, p. 7524ca_CA
dc.identifier.issn1424-8220
dc.identifier.urihttp://hdl.handle.net/10234/200881
dc.description.abstractFault diagnosis in multistage manufacturing processes (MMPs) is a challenging task where most of the research presented in the literature considers a predefined inspection scheme to identify the sources of variation and make the process diagnosable. In this paper, a sequential inspection procedure to detect the process fault based on a sequential testing algorithm and a minimum monitoring system is proposed. After the monitoring system detects that the process is out of statistical control, the features to be inspected (end of line or in process measurements) are defined sequentially according to the expected information gain of each potential inspection measurement. A case study is analyzed to prove the benefits of this approach with respect to a predefined inspection scheme and a randomized sequential inspection considering both the use and non-use of fault probabilities from historical maintenance data.ca_CA
dc.format.extent16 p.ca_CA
dc.format.mimetypeapplication/pdfca_CA
dc.language.isoengca_CA
dc.publisherMDPIca_CA
dc.relation.isPartOfSensors, 2021, vol. 21, núm. 22, p. 7524ca_CA
dc.rightsCopyright: © 2021 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https:// creativecommons.org/licenses/by/ 4.0/).ca_CA
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/ca_CA
dc.subjectsequential inspectionca_CA
dc.subjectfault detectionca_CA
dc.subjectmultistage processca_CA
dc.subjectinformation gainca_CA
dc.subjectBayesian inferenceca_CA
dc.titleA Sequential Inspection Procedure for Fault Detection in Multistage Manufacturing Processesca_CA
dc.typeinfo:eu-repo/semantics/articleca_CA
dc.identifier.doihttps://doi.org/10.3390/s21227524
dc.rights.accessRightsinfo:eu-repo/semantics/openAccessca_CA
dc.relation.publisherVersionhttps://www.mdpi.com/1424-8220/21/22/7524ca_CA
dc.type.versioninfo:eu-repo/semantics/publishedVersionca_CA
project.funder.identifierUJIca_CA
project.funder.nameUniversitat Jaume Ica_CA
oaire.awardNumberUJI-B2020-33ca_CA


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Copyright: © 2021 by the authors.
Licensee MDPI, Basel, Switzerland.
This article is an open access article
distributed under the terms and
conditions of the Creative Commons
Attribution (CC BY) license (https://
creativecommons.org/licenses/by/
4.0/).
Excepto si se señala otra cosa, la licencia del ítem se describe como: Copyright: © 2021 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https:// creativecommons.org/licenses/by/ 4.0/).