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A Sequential Inspection Procedure for Fault Detection in Multistage Manufacturing Processes
dc.contributor.author | Moliner-Heredia, Rubén | |
dc.contributor.author | Bruscas Bellido, Gracia M. | |
dc.contributor.author | Abellán-Nebot, José V. | |
dc.contributor.author | Peñarrocha-Alós, Ignacio | |
dc.date.accessioned | 2022-11-23T15:39:12Z | |
dc.date.available | 2022-11-23T15:39:12Z | |
dc.date.issued | 2021 | |
dc.identifier.citation | MOLINER-HEREDIA, Rubén, et al. A Sequential Inspection Procedure for Fault Detection in Multistage Manufacturing Processes. Sensors, 2021, vol. 21, núm. 22, p. 7524 | ca_CA |
dc.identifier.issn | 1424-8220 | |
dc.identifier.uri | http://hdl.handle.net/10234/200881 | |
dc.description.abstract | Fault diagnosis in multistage manufacturing processes (MMPs) is a challenging task where most of the research presented in the literature considers a predefined inspection scheme to identify the sources of variation and make the process diagnosable. In this paper, a sequential inspection procedure to detect the process fault based on a sequential testing algorithm and a minimum monitoring system is proposed. After the monitoring system detects that the process is out of statistical control, the features to be inspected (end of line or in process measurements) are defined sequentially according to the expected information gain of each potential inspection measurement. A case study is analyzed to prove the benefits of this approach with respect to a predefined inspection scheme and a randomized sequential inspection considering both the use and non-use of fault probabilities from historical maintenance data. | ca_CA |
dc.format.extent | 16 p. | ca_CA |
dc.format.mimetype | application/pdf | ca_CA |
dc.language.iso | eng | ca_CA |
dc.publisher | MDPI | ca_CA |
dc.relation.isPartOf | Sensors, 2021, vol. 21, núm. 22, p. 7524 | ca_CA |
dc.rights | Copyright: © 2021 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https:// creativecommons.org/licenses/by/ 4.0/). | ca_CA |
dc.rights.uri | http://creativecommons.org/licenses/by/4.0/ | ca_CA |
dc.subject | sequential inspection | ca_CA |
dc.subject | fault detection | ca_CA |
dc.subject | multistage process | ca_CA |
dc.subject | information gain | ca_CA |
dc.subject | Bayesian inference | ca_CA |
dc.title | A Sequential Inspection Procedure for Fault Detection in Multistage Manufacturing Processes | ca_CA |
dc.type | info:eu-repo/semantics/article | ca_CA |
dc.identifier.doi | https://doi.org/10.3390/s21227524 | |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | ca_CA |
dc.relation.publisherVersion | https://www.mdpi.com/1424-8220/21/22/7524 | ca_CA |
dc.type.version | info:eu-repo/semantics/publishedVersion | ca_CA |
project.funder.identifier | UJI | ca_CA |
project.funder.name | Universitat Jaume I | ca_CA |
oaire.awardNumber | UJI-B2020-33 | ca_CA |
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