Self-similar behavior in semiconductor superlattices
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Scholar |
Otros documentos de la autoría: Castro-Palacio, Juan Carlos; Villatoro, Francisco R.; Mendoza-Yero, Omel; Velázquez Abad, Luisberis; Monsoriu, Juan A.
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http://dx.doi.org/10.1142/S0218348X12500089 |
Metadatos
Título
Self-similar behavior in semiconductor superlatticesAutoría
Fecha de publicación
2012Editor
World Scientific Publishing CompanyISSN
0218-348X; 1793-6543Cita bibliográfica
CASTRO-PALACIO, Juan C., et al. SELF-SIMILAR BEHAVIOR IN SEMICONDUCTOR SUPERLATTICES. Fractals, 2012, vol. 20, no 01, p. 89-95.Tipo de documento
info:eu-repo/semantics/articleVersión de la editorial
http://dx.doi.org/10.1142/S0218348X12500089Versión
info:eu-repo/semantics/publishedVersionPalabras clave / Materias
Resumen
The scattering of particles in fractal superlattices has been analyzed by means of the transfer matrix method. The fractal superlattice consists of alternating layers of semiconductor materials following the rule of ... [+]
The scattering of particles in fractal superlattices has been analyzed by means of the transfer matrix method. The fractal superlattice consists of alternating layers of semiconductor materials following the rule of a Cantor set. This problem can be represented by a model of quantum particles scattering in piecewise constant potential wells. Fractal properties of the reflection coefficient versus the particle energy curves are examined comparatively to the curves when using the corresponding periodic potentials. The degree of self-similarity of the output variables has been quantified by means of the correlation function. [-]
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Fractals,Vol. 20, No. 1, (2012)Derechos de acceso
World Scientific Publishing Company
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