Self-similar behavior in semiconductor superlattices
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Other documents of the author: Castro-Palacio, Juan Carlos; Villatoro, Francisco R.; Mendoza-Yero, Omel; Velázquez Abad, Luisberis; Monsoriu, Juan A.
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http://dx.doi.org/10.1142/S0218348X12500089 |
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Title
Self-similar behavior in semiconductor superlatticesAuthor (s)
Date
2012Publisher
World Scientific Publishing CompanyISSN
0218-348X; 1793-6543Bibliographic citation
CASTRO-PALACIO, Juan C., et al. SELF-SIMILAR BEHAVIOR IN SEMICONDUCTOR SUPERLATTICES. Fractals, 2012, vol. 20, no 01, p. 89-95.Type
info:eu-repo/semantics/articlePublisher version
http://dx.doi.org/10.1142/S0218348X12500089Version
info:eu-repo/semantics/publishedVersionAbstract
The scattering of particles in fractal superlattices has been analyzed by means of the transfer matrix method. The fractal superlattice consists of alternating layers of semiconductor materials following the rule of ... [+]
The scattering of particles in fractal superlattices has been analyzed by means of the transfer matrix method. The fractal superlattice consists of alternating layers of semiconductor materials following the rule of a Cantor set. This problem can be represented by a model of quantum particles scattering in piecewise constant potential wells. Fractal properties of the reflection coefficient versus the particle energy curves are examined comparatively to the curves when using the corresponding periodic potentials. The degree of self-similarity of the output variables has been quantified by means of the correlation function. [-]
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Fractals,Vol. 20, No. 1, (2012)Rights
World Scientific Publishing Company
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