A second order approach to analyse spatial point patterns with functional marks
comunitat-uji-handle:10234/9
comunitat-uji-handle2:10234/7037
comunitat-uji-handle3:10234/8635
comunitat-uji-handle4:
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http://dx.doi.org/10.1007/s11749-010-0215-1 |
Metadades
Títol
A second order approach to analyse spatial point patterns with functional marksData de publicació
2011-11Editor
SpringerCita bibliogràfica
COMAS RODRÍGUEZ, Carlos; DELICADO, Pedro; MATEU, Jorge. A second order approach to analyse spatial point patterns with functional marks. Test (2011), v. 20, pp. 503–523Tipus de document
info:eu-repo/semantics/articleVersió de l'editorial
http://link.springer.com/article/10.1007/s11749-010-0215-1Versió
info:eu-repo/semantics/publishedVersionParaules clau / Matèries
Resum
A new second order statistic based on the mark correlation function to
analyse spatial point patterns with functional marks is presented. An edge corrected
estimator is defined and illustrated through a ... [+]
A new second order statistic based on the mark correlation function to
analyse spatial point patterns with functional marks is presented. An edge corrected
estimator is defined and illustrated through a simulation study and two data sets in-
volving two spatially explicit demographic functions, namely, the town population
pyramid and the demographic evolution from 1996 to 2008 involving 121 towns. Our
results confirm the usefulness of our approach compared with other well-established
spatial statistical tools such as the mark correlation function [-]
Publicat a
Test (2011), v. 20Drets d'accés
http://rightsstatements.org/vocab/CNE/1.0/
info:eu-repo/semantics/restrictedAccess
info:eu-repo/semantics/restrictedAccess
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