A continuous wavelet-based approach to detect anisotropic properties in spatial point processes
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http://dx.doi.org/10.1142/S0219691313500173 |
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Título
A continuous wavelet-based approach to detect anisotropic properties in spatial point processesFecha de publicación
2013Editor
World Scientific PublishingISSN
0219-6913Cita bibliográfica
D'ERCOLE, Roberto; MATEU, Jorge. A continuous wavelet-based approach to detect anisotropic properties in spatial point processes. International Journal of Wavelets, Multiresolution and Information Processing, 2013, 11.02.Tipo de documento
info:eu-repo/semantics/articleVersión de la editorial
http://www.worldscientific.com/doi/abs/10.1142/S0219691313500173?af=RVersión
info:eu-repo/semantics/publishedVersionPalabras clave / Materias
Resumen
A two-dimensional stochastic point process can be regarded as a random measure and thus represented as a (countable) sum of Delta Dirac measures concentrated at some points. Integration with respect to the point process ... [+]
A two-dimensional stochastic point process can be regarded as a random measure and thus represented as a (countable) sum of Delta Dirac measures concentrated at some points. Integration with respect to the point process itself leads to the concept of the continuous wavelet transform of a point process. Applying then suitable translation, rotation and dilation operations through a non unitary operator, we obtain a transformed point process which highlights main properties of the original point process. The choice of the mother wavelet is relevant and we thus conduct a detailed analysis proposing three two-dimensional mother wavelets. We use this approach to detect main directions present in the point process, and to test for anisotropy. [-]
Publicado en
International Journal of Wavelets, Multiresolution and Information Processing, 2013, 11.02.Derechos de acceso
© 2013 World Scientific Publishing Co. All rights reserved.
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