Listar INIT_Articles por fuente "IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING, VOL. 59, NO. 10, OCTOBER 2021"
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Robust Normalized Softmax Loss for Deep Metric Learning-Based Characterization of Remote Sensing Images With Label Noise
Institute of Electrical and Electronics Engineers (2020-12-16)Most deep metric learning-based image characterization methods exploit supervised information to model the semantic relations among the remote sensing (RS) scenes. Nonetheless, the unprecedented availability of large-scale ...