Low Frequency Impedance Spectroscopy Analysis of Thermoelectric Modules
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Títol
Low Frequency Impedance Spectroscopy Analysis of Thermoelectric ModulesData de publicació
2014-06Editor
Springer Science & Business Media; Institute of Electrical and Electronics Engineers (IEEE); Minerals, Metals and Materials Society (TMS)Cita bibliogràfica
GARCÍA-CAÑADAS, Jorge; MIN, Gao. Low frequency impedance spectroscopy analysis of thermoelectric modules. Journal of Electronic Materials, 2014, vol. 43, no 6, p. 2411-2414.Tipus de document
info:eu-repo/semantics/articleVersió de l'editorial
http://search.proquest.com/docview/1524810229?pq-origsite=gscholarParaules clau / Matèries
Resum
Impedance spectroscopy is a well-established technique for the study of
semiconductors and energy-related devices. However, in the area of thermo-
electrics (TEs), this technique is not frequently used and ... [+]
Impedance spectroscopy is a well-established technique for the study of
semiconductors and energy-related devices. However, in the area of thermo-
electrics (TEs), this technique is not frequently used and there is a lack of a
physical background for a proper interpretation of the results. Usually, in the
low frequency regime, the impedance spectrum of TE modules working in
cooling mode is characterized by a semicircle which can be modelled as a
parallel connection of a resistor and a capacitor. Here, we present a theoretical
analysis to understand the origin of both parameters in bulk TE modules
working as Peltier coolers. The analysis introduces a
thermoelectric capaci-
tance
and a
thermoelectric resistance
that are defined by the temperature, the
Seebeck coefficient and the thermal properties of the module (specific heat and
thermal conductivity, respectively). The product of both provides a time con-
stant that directly relates to the thermal diffusivity. Our analysis provides a
theoretical model able to interpret the low frequency results and obtain rele-
vant thermal parameters from a single impedance measurement. [-]
Publicat a
Journal of Electronic Materials 43.6 (Jun 2014):Drets d'accés
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