Listar INIT_Congressos i Informes por autoría "98510ac0-2fac-46a6-8140-c32ee44f1bff"
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Generalized Scalable Neighborhood Component Analysis for Single and Multi-Label Remote Sensing Image Characterization
kang, jian; SCARANO, Antonio; Plaza, Antonio IEEE (2021)Deep metric learning has recently become a prominent technology for the semantic understanding ofremote sensing (RS) scenes due to its great potential for characterizing visual semantics. However, state-of-the-art deep ...