Elucidating Capacitance and Resistance Terms in Confined Electroactive Molecular Layers
Impacto
Scholar |
Otros documentos de la autoría: Bueno, Paulo R.; Fabregat-Santiago, Francisco; Davis, Jason J.
Metadatos
Mostrar el registro completo del ítemcomunitat-uji-handle:10234/9
comunitat-uji-handle2:10234/2507
comunitat-uji-handle3:10234/6973
comunitat-uji-handle4:
INVESTIGACIONEste recurso está restringido
http://dx.doi.org/10.1021/ac303018d |
Metadatos
Título
Elucidating Capacitance and Resistance Terms in Confined Electroactive Molecular LayersFecha de publicación
2013Editor
American Chemical SocietyCita bibliográfica
BUENO, P. R.; FABREGAT SANTIAGO, F.; DAVIS, J. J. Elucidating Capacitance and Resistance Terms in Confined Electroactive Molecular Layers. Analytical Chemistry, v. 85, n. 1 (2013), p. 411-417Tipo de documento
info:eu-repo/semantics/articleVersión de la editorial
http://pubs.acs.org/doi/abs/10.1021/ac303018dVersión
info:eu-repo/semantics/publishedVersionPalabras clave / Materias
Resumen
Electrochemical analyses on confined electroactive molecular layers, herein exemplified with electroactive self-assembled monolayers, sample current contributions that are significantly influenced by additional ... [+]
Electrochemical analyses on confined electroactive molecular layers, herein exemplified with electroactive self-assembled monolayers, sample current contributions that are significantly influenced by additional nonfaradaic and uncompensated resistance effects that, though unresolved, can strongly distort redox analysis. Prior work has shown that impedance-derived capacitance spectroscopy approaches can cleanly resolve all contributions generated at such films, including those which are related to the layer dipolar/electrostatic relaxation characteristics. We show herein that, in isolating the faradaic and nonfaradaic contributions present within an improved equivalent circuit description of such interfaces, it is possible to accurately simulate subsequently observed cyclic voltammograms (that is, generated current versus potential patterns map accurately onto frequency domain measurements). Not only does this enable a frequency-resolved quantification of all components present, and in so doing, a full validation of the equivalent circuit model utilized, but also facilitates the generation of background subtracted cyclic voltammograms remarkably free from all but faradaic contributions. [-]
Publicado en
Analytical Chemistry, v. 85, n. 1 (2013)Derechos de acceso
http://rightsstatements.org/vocab/CNE/1.0/
info:eu-repo/semantics/restrictedAccess
info:eu-repo/semantics/restrictedAccess
Aparece en las colecciones
- FCA_Articles [501]