Spatial threshold exceedance analysis through marked point processes
Metadata
Show full item recordcomunitat-uji-handle:10234/9
comunitat-uji-handle2:10234/43662
comunitat-uji-handle3:10234/43643
comunitat-uji-handle4:
INVESTIGACIONThis resource is restricted
http://dx.doi.org/10.1002/env.1141 |
Metadata
Title
Spatial threshold exceedance analysis through marked point processesDate
2012Publisher
Wiley- BlackwellISSN
1099-095XType
info:eu-repo/semantics/articlePublisher version
http://onlinelibrary.wiley.com/doi/10.1002/env.1141/abstractVersion
info:eu-repo/semantics/publishedVersionSubject
Abstract
Indicators of recurrence, persistence and, in general, distribution patterns of extremal events defined by random field threshold exceedances provide relevant information on critical phenomena for risk assessment. ... [+]
Indicators of recurrence, persistence and, in general, distribution patterns of extremal events defined by random field threshold exceedances provide relevant information on critical phenomena for risk assessment. Such indicators are directly related to geometrical properties describing the structure of the corresponding excursion sets. Given the intrinsic nature of the latter, spatial marked point processes provide a natural approach to analyze distribution patterns of such extremal events in relation to specific characteristics of interest. In this paper, on the basis of simulations from flexible models separating memory and fractality effects, the structure of threshold exceedances is analyzed in terms of various second-order characteristics. In particular, the study is focused on the variations in size, boundary roughness, and distance heterogeneities in the components of excursion sets, as well as in clustering/inhibition patterns, depending on both the underlying model parameters and the threshold specifications. The methodology proposed is applied to a real data set on surface reflected solar radiation. [-]
Is part of
Environmetrics. 2012, Volume 23, Issue 1Rights
Copyright © 2011 John Wiley & Sons, Ltd.
[The definitive version is available at www3.interscience.wiley.com]
http://rightsstatements.org/vocab/InC/1.0/
info:eu-repo/semantics/restrictedAccess
[The definitive version is available at www3.interscience.wiley.com]
http://rightsstatements.org/vocab/InC/1.0/
info:eu-repo/semantics/restrictedAccess
This item appears in the folowing collection(s)
- INIT_Articles [743]