Kinetics of occupancy of defect states in poly(3-hexylthiophene): fullerene solar cells
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Otros documentos de la autoría: Garcia-Belmonte, Germà; Boix, Pablo P; Ajuria, Jon; Etxebarria, Ikerne; Palacios, Roberto
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Mostrar el registro completo del ítemcomunitat-uji-handle:10234/9
comunitat-uji-handle2:10234/2507
comunitat-uji-handle3:10234/6973
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Título
Kinetics of occupancy of defect states in poly(3-hexylthiophene): fullerene solar cellsFecha de publicación
2012-01Editor
ElsevierTipo de documento
info:eu-repo/semantics/articleVersión de la editorial
http://www.sciencedirect.com/science/article/pii/S0040609011016920Versión
info:eu-repo/semantics/submittedVersionPalabras clave / Materias
Resumen
Energetics and kinetics of defects in the effective band gap of organic bulk heterojunctions are determined by means of capacitance methods. The technique consists of calculating the junction capacitance derivative ... [+]
Energetics and kinetics of defects in the effective band gap of organic bulk heterojunctions are determined by means of capacitance methods. The technique consists of calculating the junction capacitance derivative with respect to the angular frequency of the small voltage perturbation applied to thin film poly(3-hexylthiophene) (P3HT) and [6,6]-phenyl C61-butyric acid methyl ester solar cells, varying the temperature. The analysis reveals the presence of defect bands (shallow acceptors) centered at E0 = 35 meV above the highest-occupied molecular orbital level of P3HT. The total density of defects results of order 1016 cm− 3. Characteristic frequency is obtained to be situated within the range of 1–10 Hz. Defect bands acting as negatively charged levels are responsible for the p-doping of the active layer and the band-bending near the cathode contact, as derived from Mott–Schottky capacitance–voltage analysis. [-]
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Thin Solid Films, Volume 520, Issue 6, January 2012Derechos de acceso
http://rightsstatements.org/vocab/CNE/1.0/
info:eu-repo/semantics/openAccess
info:eu-repo/semantics/openAccess
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