Analysis of the Influence of Selective Contact Heterojunctions on the Performance of Perovskite Solar Cells
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Other documents of the author: García-Rosell, Manuel; Bou, Agustín; Jiménez Tejada, Juan Antonio; Bisquert, Juan; Lopez-Varo, Pilar
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comunitat-uji-handle3:10234/160293
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Title
Analysis of the Influence of Selective Contact Heterojunctions on the Performance of Perovskite Solar CellsAuthor (s)
Date
2018-03Publisher
ACSBibliographic citation
GARCÍA-ROSELL, Manuel, et al. Analysis of the Influence of Selective Contact Heterojunctions on the Performance of Perovskite Solar Cells. J. Phys. Chem. C, 2018, 122, 25, 13920-13925Type
info:eu-repo/semantics/articlePublisher version
https://pubs.acs.org/doi/abs/10.1021/acs.jpcc.8b01070Version
info:eu-repo/semantics/submittedVersionSubject
Abstract
Knowledge of the mechanisms that take place at the selective contacts, located at the
charge-transport-layer (CTL)/perovskite heterojunctions, is crucial for the optimization
of perovskite solar cells. Anomalous ... [+]
Knowledge of the mechanisms that take place at the selective contacts, located at the
charge-transport-layer (CTL)/perovskite heterojunctions, is crucial for the optimization
of perovskite solar cells. Anomalous high values of the low-frequency capacitance at
open-circuit and short-circuit indicate a high accumulation of charge at the interfaces,
which could hinder the extraction of charge and increase hysteresis in current-voltage
curve. To investigate this issue, we develop a simulation model based on the drift
diffusion differential equations with specific boundary conditions at the interfaces. We
have simulated the CTL/perovskite structures as part of the entire perovskite solar cell,
in order to establish the realistic energy profile across the interface. The energy profile
allows to detect in which situations free charge accumulation at the interfaces exists, and
to quantify this accumulation as a function of the device and material parameters. We
discuss the role and the importance of each CTL/perovskite interface at open-circuit and
short-circuit. We conclude that the accumulation of charge at the interfaces is strongly
affected by the specific contact materials, and critically depends on a compromise
between the presence of ions, the values of the carrier mobility, and the interfacial and
bulk recombination parameters. [-]
Investigation project
MINECO of Spain (Project MAT2016-76892-C3- 1-R, MAT2016-76892-C3-3-R) ; Universidad de Granada (Grant Contrato Puente).Rights
Copyright © 2018 American Chemical Society
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