A second order approach to analyse spatial point patterns with functional marks
comunitat-uji-handle:10234/9
comunitat-uji-handle2:10234/7037
comunitat-uji-handle3:10234/8635
comunitat-uji-handle4:
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http://dx.doi.org/10.1007/s11749-010-0215-1 |
Metadata
Title
A second order approach to analyse spatial point patterns with functional marksDate
2011-11Publisher
SpringerBibliographic citation
COMAS RODRÍGUEZ, Carlos; DELICADO, Pedro; MATEU, Jorge. A second order approach to analyse spatial point patterns with functional marks. Test (2011), v. 20, pp. 503–523Type
info:eu-repo/semantics/articlePublisher version
http://link.springer.com/article/10.1007/s11749-010-0215-1Version
info:eu-repo/semantics/publishedVersionSubject
Abstract
A new second order statistic based on the mark correlation function to
analyse spatial point patterns with functional marks is presented. An edge corrected
estimator is defined and illustrated through a ... [+]
A new second order statistic based on the mark correlation function to
analyse spatial point patterns with functional marks is presented. An edge corrected
estimator is defined and illustrated through a simulation study and two data sets in-
volving two spatially explicit demographic functions, namely, the town population
pyramid and the demographic evolution from 1996 to 2008 involving 121 towns. Our
results confirm the usefulness of our approach compared with other well-established
spatial statistical tools such as the mark correlation function [-]
Is part of
Test (2011), v. 20Rights
http://rightsstatements.org/vocab/CNE/1.0/
info:eu-repo/semantics/restrictedAccess
info:eu-repo/semantics/restrictedAccess
This item appears in the folowing collection(s)
- MAT_Articles [749]