Shelf Life Degradation of Bulk Heterojunction Solar Cells: Intrinsic Evolution of Charge Transfer Complex
View/ Open
Impact
Scholar |
Other documents of the author: Guerrero, Antonio; Heidari, Hamed; Ripollés Sanchis, Teresa; Kovalenko, Alexander; Pfannmöller, Martin; Bals, Sara; Kaufmann, Louis-Dominique; Bisquert, Juan; Garcia-Belmonte, Germà
Metadata
Show full item recordcomunitat-uji-handle:10234/9
comunitat-uji-handle2:10234/2507
comunitat-uji-handle3:10234/6973
comunitat-uji-handle4:
INVESTIGACIONMetadata
Title
Shelf Life Degradation of Bulk Heterojunction Solar Cells: Intrinsic Evolution of Charge Transfer ComplexAuthor (s)
Date
2015Publisher
WileyISSN
1614-6832; 1614-6840Bibliographic citation
GUERRERO, Antonio, et al. Shelf life degradation of bulk heterojunction solar cells: Intrinsic evolution of charge transfer complex. Advanced Energy Materials, 2015, vol. 5, no 7.Type
info:eu-repo/semantics/articlePublisher version
http://onlinelibrary.wiley.com/doi/10.1002/aenm.201401997/fullVersion
info:eu-repo/semantics/submittedVersionSubject
Abstract
Achievement of long-term stability of organic photovoltaics is currently one of the major topics for this technology to reach maturity. Most of the techniques used to reveal degradation pathways are destructive and/or ... [+]
Achievement of long-term stability of organic photovoltaics is currently one of the major topics for this technology to reach maturity. Most of the techniques used to reveal degradation pathways are destructive and/or do not allow for real-time measurements in operating devices. Here, three different, nondestructive techniques able to provide real-time information, namely, film absorbance, capacitance–voltage (C–V), and impedance spectroscopy (IS), are combined over a period of 1 year using non-accelerated intrinsic degradation conditions. It is discerned between chemical modifications in the active layer, physical processes taking place in the bulk of the blend from those at the active layer/contact interfaces. In particular, it is observed that during the ageing experiment, the main source for device performance degradation is the formation of donor–acceptor charge-transfer complex (math formula–math formula) that acts as an exciton quencher. Generation of these radical species diminishes photocurrent and reduces open-circuit voltage by the creation of electronic defect states. Conclusions extracted from absorption, C–V, and IS measurements will be further supported by a range of other techniques such as atomic force microscopy, X-ray diffraction, and dark-field imaging of scanning transmission electron microscopy on ultrathin cross-sections. [-]
Is part of
Advanced Energy Materials, 2015, vol. 5, no 7Rights
Copyright © John Wiley & Sons
http://rightsstatements.org/vocab/InC/1.0/
info:eu-repo/semantics/openAccess
http://rightsstatements.org/vocab/InC/1.0/
info:eu-repo/semantics/openAccess
This item appears in the folowing collection(s)
- FCA_Articles [501]