Diffraction-Based Phase Calibration of Spatial Light Modulators With Binary Phase Fresnel Lenses
Visualitza/
Impacte
Scholar |
Altres documents de l'autoria: Mendoza-Yero, Omel; Mínguez-Vega, Gladys; Martínez-León, Lluís; Carbonell Leal, Miguel; Fernández Alonso, Mercedes; Doñate-Buendía, Carlos; Pérez Vizcaíno, Jorge; Lancis, Jesús
Metadades
Mostra el registre complet de l'elementcomunitat-uji-handle:10234/9
comunitat-uji-handle2:10234/2507
comunitat-uji-handle3:10234/6973
comunitat-uji-handle4:
INVESTIGACIONMetadades
Títol
Diffraction-Based Phase Calibration of Spatial Light Modulators With Binary Phase Fresnel LensesAutoria
Data de publicació
2016Editor
IEEECita bibliogràfica
MENDOZA-YERO, Omel, et al. Diffraction-Based Phase Calibration of Spatial Light Modulators With Binary Phase Fresnel Lenses. Journal of Display Technology, 2016, vol. 12, no 10, p. 1027-1032.Tipus de document
info:eu-repo/semantics/articleVersió de l'editorial
https://www.osapublishing.org/jdt/abstract.cfm?uri=jdt-12-10-1027Versió
info:eu-repo/semantics/acceptedVersionParaules clau / Matèries
Resum
We propose a simple and robust method to determine the calibration function of phase-only spatial light modulators (SLMs). The proposed method is based on the codification of binary phase Fresnel lenses (BPFLs) onto ... [+]
We propose a simple and robust method to determine the calibration function of phase-only spatial light modulators (SLMs). The proposed method is based on the codification of binary phase Fresnel lenses (BPFLs) onto an SLM. At the principal focal plane of a BPFL, the focal irradiance is collected with a single device just able to measure intensity-dependent signals, e.g., CCD camera, photodiodes, power meter, etc. In accordance with the theoretical model, it is easy to extract the desired calibration function from the numerical processing of the experimental data. The lack of an interferometric optical arrangement, and the use of minimal optical components allow a fast alignment of the setup, which is in fact poorly dependent on environmental fluctuations. In addition, the effects of the zero-order, commonly presented in the diffraction-based methods, are drastically reduced because measurements are carried out only in the vicinity of the focal points, where main light contributions are coming from diffracted light at the BPFL. Furthermore, owing to the simplicity of the method, full calibration can be done, in most practical situations, without moving the SLM from the original place for a given application. [-]
Publicat a
Journal of Display Technology, 2016, vol. 12, no 10Drets d'accés
Apareix a les col.leccions
- FCA_Articles [501]