Relaxation of Electron Carriers in the Density of States of Nanocrystalline TiO2
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Otros documentos de la autoría: Bertoluzzi, Luca; Herraiz Cardona, Isaac; Gottesman, Ronen; Zaban, Arie; Bisquert, Juan
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Mostrar el registro completo del ítemcomunitat-uji-handle:10234/9
comunitat-uji-handle2:10234/2507
comunitat-uji-handle3:10234/6973
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http://dx.doi.org/10.1021/jz4027584 |
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Título
Relaxation of Electron Carriers in the Density of States of Nanocrystalline TiO2Fecha de publicación
2014-01Editor
American Chemical SocietyCita bibliográfica
BERTOLUZZI, Luca, et al. Relaxation of electron carriers in the density of states of nanocrystalline tio2. The Journal of Physical Chemistry Letters, 2014, 5.4: 689-694.Tipo de documento
info:eu-repo/semantics/articleVersión de la editorial
http://pubs.acs.org/doi/abs/10.1021/jz4027584Versión
info:eu-repo/semantics/publishedVersionPalabras clave / Materias
Resumen
Band gap localized states and surface states play a dominant role in the application of nanocrystalline metal oxides to photovoltaics and solar fuel production. Electrons injected in nanocrystalline TiO2 by voltage ... [+]
Band gap localized states and surface states play a dominant role in the application of nanocrystalline metal oxides to photovoltaics and solar fuel production. Electrons injected in nanocrystalline TiO2 by voltage or photogeneration are mainly located in band gap states. Therefore, charging a nanoparticulate semiconductor network allows one to recover the density of states (DOS) in the energy axis. However, shallow traps remain in equilibrium with the conduction band electrons, while deep traps do not. We show that the characteristic peak of the apparent DOS mixes an exponential DOS and a monoenergetic surface state. A model that incorporates the trap’s kinetics proves to be very efficient to assess the important parameters that determine both contributions via variation of charging rate. Contrary to the common theory, we demonstrate that the peculiar capacitance peak of nanocrystalline TiO2 can be mainly attributed, in some cases, to deep traps in the exponential distribution. [-]
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J. Phys. Chem. Lett., 2014, 5 (4)Derechos de acceso
Copyright © 2014 American Chemical Society
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