Diffraction-Based Phase Calibration of Spatial Light Modulators With Binary Phase Fresnel Lenses
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Otros documentos de la autoría: Mendoza-Yero, Omel; Mínguez-Vega, Gladys; Martínez-León, Lluís; Carbonell Leal, Miguel; Fernández Alonso, Mercedes; Doñate-Buendía, Carlos; Pérez Vizcaíno, Jorge; Lancis, Jesús
Metadatos
Mostrar el registro completo del ítemcomunitat-uji-handle:10234/9
comunitat-uji-handle2:10234/2507
comunitat-uji-handle3:10234/6973
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Título
Diffraction-Based Phase Calibration of Spatial Light Modulators With Binary Phase Fresnel LensesAutoría
Fecha de publicación
2016Editor
IEEECita bibliográfica
MENDOZA-YERO, Omel, et al. Diffraction-Based Phase Calibration of Spatial Light Modulators With Binary Phase Fresnel Lenses. Journal of Display Technology, 2016, vol. 12, no 10, p. 1027-1032.Tipo de documento
info:eu-repo/semantics/articleVersión de la editorial
https://www.osapublishing.org/jdt/abstract.cfm?uri=jdt-12-10-1027Versión
info:eu-repo/semantics/acceptedVersionPalabras clave / Materias
Resumen
We propose a simple and robust method to determine the calibration function of phase-only spatial light modulators (SLMs). The proposed method is based on the codification of binary phase Fresnel lenses (BPFLs) onto ... [+]
We propose a simple and robust method to determine the calibration function of phase-only spatial light modulators (SLMs). The proposed method is based on the codification of binary phase Fresnel lenses (BPFLs) onto an SLM. At the principal focal plane of a BPFL, the focal irradiance is collected with a single device just able to measure intensity-dependent signals, e.g., CCD camera, photodiodes, power meter, etc. In accordance with the theoretical model, it is easy to extract the desired calibration function from the numerical processing of the experimental data. The lack of an interferometric optical arrangement, and the use of minimal optical components allow a fast alignment of the setup, which is in fact poorly dependent on environmental fluctuations. In addition, the effects of the zero-order, commonly presented in the diffraction-based methods, are drastically reduced because measurements are carried out only in the vicinity of the focal points, where main light contributions are coming from diffracted light at the BPFL. Furthermore, owing to the simplicity of the method, full calibration can be done, in most practical situations, without moving the SLM from the original place for a given application. [-]
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Journal of Display Technology, 2016, vol. 12, no 10Derechos de acceso
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