• openAccess   Testing of three-phase equipment under voltage sags 

      Rolán Blanco, Alejandro; Córcoles López, Felipe; Pedra Durán, Joaquín; Monjo, Lluís; Bogarra, Santiago Institution of Engineering and Technology (IET) (2015-04)
      This paper provides insight into the testing of three-phase equipment exposed to voltage sags caused by faults. The voltage sag recovers at the fault-current zeros, leading to a `discrete' voltage recovery, that is, the ...