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On measures of dissimilarity between point patterns: Classification based on prototypes and multidimensional scaling
Mateu, Jorge; Schoenberg, Frederic P.; Diez, David M.; González Monsalve, Jonatan Andrey; Lu, Weipeng Wiley (2015-03)This paper presents a collection of dissimilarity measures to describe and then classify spatial point patterns when multiple replicates of different types are available for analysis. In particular, we consider a range of ...